Flex-circuit chip-to-chip interconnects

Proceedings - Electronic Components and Technology Conference

Volumn 2006, Issue , 2006, Pages 1853-1859

  Braunisch, Henning ^a   Jaussi, James E ^a   Mix, Jason A ^a   Trobough, Mark B ^a   Horine, Bryce D ^a   Prokofiev, Victor ^a   Lu, Daoqiang ^a   Baskaran, Rajashree ^a   Meier, Pascal C H ^a   Han, Dong Ho ^a   Mallory, Kent E ^a   Leddige, Michael W ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BANDWIDTH; CMOS INTEGRATED CIRCUITS; ELECTRIC CONNECTORS; ELECTRIC POTENTIAL; MICROPROCESSOR CHIPS;

CHIP-TO-CHIP INTERCONNECT; CMOS TEST VEHICLE; FLEX RIBBON; FLEX-CIRCUIT TECHNOLOGY;

OPTICAL INTERCONNECTS;

EID: 33845567938     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645912     Document Type: Conference Paper

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