Reverse leakage current instability of power fast switching diodes operating at high junction temperature

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 2005, Issue , 2005, Pages 537-540

  Obreja, V V N ^a   Codreanu, C ^a   Nuttall, K I ^b  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES   (Romania)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; POWER ELECTRONICS; SEMICONDUCTOR JUNCTIONS; SWITCHING SYSTEMS; TEMPERATURE MEASUREMENT;

JUNCTION TEMPERATURE; REVERSE LEAKAGE CURRENT INSTABILITY; SWITCHING DIODES;

DIODES;

EID: 33845314664     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESC.2005.1581677     Document Type: Conference Paper

References (10)

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