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Volumn 1, Issue , 2006, Pages 79-82

Influence of photo-initiator concentration on residual mechanical stress in SU-8 thin films

Author keywords

Fabrication; Negative photoresist; Photo initiator; Residual stress; SU 8 films

Indexed keywords

CONCENTRATION (PROCESS); PHOTOCHEMICAL REACTIONS; PHOTOLITHOGRAPHY; RESIDUAL STRESSES; THIN FILMS;

EID: 33845232291     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (9)
  • 3
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    • High-aspect-ratio, ultrathick, negative-tone near-UV photoresist and its applications for MEMS
    • H. Lorenz, M. Despont, N. Fahrni, J. Brugger, P. Vettiger and P. Renaud, "High-aspect-ratio, ultrathick, negative-tone near-UV photoresist and its applications for MEMS", Sensors and Actuators A, Vol. 64, pp 33-39, 1998.
    • (1998) Sensors and Actuators A , vol.64 , pp. 33-39
    • Lorenz, H.1    Despont, M.2    Fahrni, N.3    Brugger, J.4    Vettiger, P.5    Renaud, P.6
  • 5
    • 0037005964 scopus 로고    scopus 로고
    • SU8 resist for low-cost X-ray patterning of high-resolution, high-aspect-ratio MEMS
    • C.G. Khan Malek, "SU8 resist for low-cost X-ray patterning of high-resolution, high-aspect-ratio MEMS", Microelectronics Journal, Vol. 33, pp 101-105, 2002.
    • (2002) Microelectronics Journal , vol.33 , pp. 101-105
    • Malek, C.G.K.1
  • 6
    • 0031685672 scopus 로고    scopus 로고
    • Mechanical characterization of a new high-aspect-ratio near UV-photoresist
    • H. Lorenz, M. Laudon and P. Renaud, "Mechanical characterization of a new high-aspect-ratio near UV-photoresist", Microelectronic Engineering, Vol. 41/42, pp 371-374, 1998.
    • (1998) Microelectronic Engineering , vol.41-42 , pp. 371-374
    • Lorenz, H.1    Laudon, M.2    Renaud, P.3
  • 8
    • 0022717983 scopus 로고
    • Fabrication of microstructures with extreme structural heights by synchrotron radiation lithography, galvanoforming and plastic forming (LIGA process)
    • E.W. Becker, W. Ehrfeld and P. Hagman, "Fabrication of microstructures with extreme structural heights by synchrotron radiation lithography, galvanoforming and plastic forming (LIGA process), Microelectronic Engineering, Vol.4, pp 35-56, 1986.
    • (1986) Microelectronic Engineering , vol.4 , pp. 35-56
    • Becker, E.W.1    Ehrfeld, W.2    Hagman, P.3
  • 9
    • 33747616171 scopus 로고    scopus 로고
    • Low stress ultra-thick SU-8 UV photolithography process for MEMS
    • B. Li, M. Liu and Q. Chen "Low stress ultra-thick SU-8 UV photolithography process for MEMS"; J. Microlith., Microfab., Microsyst., 2005, Vol. 4 (4), pp43008-43013.
    • (2005) J. Microlith., Microfab., Microsyst. , vol.4 , Issue.4 , pp. 43008-43013
    • Li, B.1    Liu, M.2    Chen, Q.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.