메뉴 건너뛰기




Volumn 100, Issue 10, 2006, Pages

Nano- and microscale adhesion energy measurement for Au-Au contacts in microswitch structures

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION ENERGIES; ADHESION ENERGY MEASUREMENT; FRACTURE MECHANICS MODELS; MICROSWITCH STRUCTURES;

EID: 33845225607     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2388688     Document Type: Article
Times cited : (14)

References (27)
  • 4
    • 33845186721 scopus 로고    scopus 로고
    • C. H. Mastrangelo, MRS Meeting, Boston, MA, 1999 (unpublished).
    • (1999)
    • Mastrangelo, C.H.1
  • 22
    • 33845203258 scopus 로고    scopus 로고
    • Digital Instruments Veeco Metrology, 112 Robin Hill Rd, Santa Barbara, CA
    • Force Imaging, Support Note No. 228, Rev. E, Digital Instruments (Veeco Metrology, 112 Robin Hill Rd, Santa Barbara, CA, 1999).
    • (1999) Force Imaging, Support Note No. 228, Rev. E
  • 23
    • 33845187476 scopus 로고    scopus 로고
    • 6th ed. (Wiley, New York
    • W. D. Callister, Materials science and engineering: An introduction, 6th ed. (Wiley, New York, 2003).
    • (2003)
    • Callister, W.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.