|
Volumn 5, Issue 7, 2005, Pages 1515-1518
|
Controlled placement of individual carbon nanotubes
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHIRAL INDEX;
ELECTRICAL CHARACTERIZATION;
SUBSTRATE MATERIALS;
CATALYSTS;
CHEMICAL VAPOR DEPOSITION;
CMOS INTEGRATED CIRCUITS;
SILICA;
SILICON WAFERS;
SUBSTRATES;
CARBON NANOTUBES;
CARBON NANOTUBE;
ARTICLE;
CHEMISTRY;
CRYSTALLIZATION;
ELECTROCHEMISTRY;
EVALUATION;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
PARTICLE SIZE;
ULTRASTRUCTURE;
CRYSTALLIZATION;
ELECTROCHEMISTRY;
MATERIALS TESTING;
NANOTECHNOLOGY;
NANOTUBES, CARBON;
PARTICLE SIZE;
|
EID: 23144468033
PISSN: 15306984
EISSN: None
Source Type: Journal
DOI: 10.1021/nl050886a Document Type: Article |
Times cited : (83)
|
References (15)
|