Improving scratch-pad memory reliability through compiler-guided data block duplication

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn 2005, Issue , 2005, Pages 1002-1005

  Li, F ^a   Chen, G ^a   Kandemir, M ^a   Kolcu, I ^b  

^a The Pennsylvania State University   (United States)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED SYSTEMS; ERROR CORRECTION; MICROPROCESSOR CHIPS; OPTIMIZATION; SECURITY OF DATA; SOFTWARE ENGINEERING;

DATA BLOCK DUPLICATION; EVER SCALING PROCESS TECHNOLOGY; POWER SAVING TECHNIQUES; SCRATCH PAD MEMORIES (SPM);

DATA STORAGE EQUIPMENT;

EID: 33751396173     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560208     Document Type: Conference Paper

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