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Volumn , Issue , 2001, Pages 297-301

System safety through automatic high-level code transformations: An experimental evaluation

Author keywords

[No Author keywords available]

Indexed keywords

CODE TRANSFORMATION; DETECTION CAPABILITY; EXPERIMENTAL EVALUATION; ON-LINE DETECTION; SOFTWARE AND HARDWARES; SOFTWARE MODIFICATION; SYSTEM SAFETY; TRANSIENT ERRORS;

EID: 0142226768     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915040     Document Type: Conference Paper
Times cited : (12)

References (12)
  • 1
    • 0016522101 scopus 로고
    • System structure for software fault tolerant
    • June
    • B. Randell, "System Structure for Software Fault Tolerant", IEEE Trans, on Software Engineering, Vol. 1, No. 2, June 1975, pp. 220-232
    • (1975) IEEE Trans, on Software Engineering , vol.1 , Issue.2 , pp. 220-232
    • Randell, B.1
  • 2
    • 0022252695 scopus 로고
    • The N-version approach to fault-tolerant software
    • Dec.
    • A. Avizienis, "The N-Version Approach to Fault-Tolerant Software", IEEE Trans. On Software Engineering, Vol. 11, No. 12, Dec. 1985, pp. 1491-1501
    • (1985) IEEE Trans. on Software Engineering , vol.11 , Issue.12 , pp. 1491-1501
    • Avizienis, A.1
  • 3
    • 0021439162 scopus 로고
    • Algorithm-based fault tolerance for matrix operations
    • December
    • K. H. Huang, J. A. Abraham, "Algorithm-Based Fault Tolerance for Matrix Operations", IEEE Trans. on Computers, vol. 33, December 1984, pp. 518-528
    • (1984) IEEE Trans. on Computers , vol.33 , pp. 518-528
    • Huang, K.H.1    Abraham, J.A.2
  • 5
    • 0025439730 scopus 로고
    • Continuous signature monitoring: Low-cost concurrent detection of processor control errors
    • June
    • K. Wilken, J. P. Shen, "Continuous Signature Monitoring: Low-Cost Concurrent Detection of Processor Control Errors", IEEE Trans, on Computer-Aided Design, Vol. 9, No. 6, June 1990, pp. 629-641
    • (1990) IEEE Trans, on Computer-Aided Design , vol.9 , Issue.6 , pp. 629-641
    • Wilken, K.1    Shen, J.P.2
  • 7
    • 0032684765 scopus 로고    scopus 로고
    • Time redundancy based soft-error tolerance to rescue nanometer technologies
    • M. Nicolaidis, "Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies", VTS'99: IEEE VLSI Test Symposium, 1999, pp. 86-94
    • (1999) VTS'99: IEEE VLSI Test Symposium , pp. 86-94
    • Nicolaidis, M.1
  • 10
    • 0003645289 scopus 로고
    • 2ndition October, O'Reilly & Associates, Inc
    • J. Levine, T. Mason, D. Brown, Lex & Yacc, 2nd Edition October 1992, O'Reilly & Associates, Inc.
    • (1992) Lex & Yacc
    • Levine, J.1    Mason, T.2    Brown, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.