Stress effect on critical thickness in ferroelectric thin films

Integrated Ferroelectrics

Volumn 43, Issue , 2002, Pages 19-30

  Zhang, Jian ^a   Wu, Zhenhuai ^b   Yin, Zhen ^a   Zhang, Ming Sheng ^a  

^a NANJING UNIVERSITY   (China)

^b Chuzhou Normal College   (China)

Author keywords

Critical thickness; Ferroelectric thin film; Phase diagram; Stress effect

Indexed keywords

EPITAXIAL GROWTH; FERROELECTRICITY; MONOLAYERS; PHASE DIAGRAMS; STRESS ANALYSIS; THERMAL EFFECTS;

CRITICAL THICKNESS; EPITAXIAL THIN FILMS; STRESS EFFECTS;

FERROELECTRIC THIN FILMS;

EID: 33751285480     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580212370     Document Type: Article

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