Delay test pattern generation considering crosstalk-induced effects

Proceedings of the Asian Test Symposium

Volumn 2003-January, Issue , 2003, Pages 178-183

  Li, Huawei ^a   Zhang, Yue ^b   Li, Xiaowei ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b NATIONAL KEY LABORATORY FOR REMANUFACTURING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; INTEGRATED CIRCUIT TESTING;

CRITICAL PATHS; DEEP SUB-MICRON; DELAY EFFECTS; DELAY TESTING; DESIGN TRENDS; DESIGN VALIDATION; TEST EFFECTIVENESS; TEST PROBLEM;

TESTING;

EID: 33751117607     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2003.1250806     Document Type: Conference Paper

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