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Volumn 40, Issue 3, 1997, Pages 250-257

Boolean process

Author keywords

Boolean process; Path sensitization; Waveform; Waveform limit

Indexed keywords


EID: 0343205869     PISSN: 10069321     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02916600     Document Type: Article
Times cited : (15)

References (7)
  • 1
    • 0022020113 scopus 로고
    • A temporal logic for multilevel reasoning about hardware
    • Moszkowski, B., A temporal logic for multilevel reasoning about hardware, Computer, 1985, 18(2): 10.
    • (1985) Computer , vol.18 , Issue.2 , pp. 10
    • Moszkowski, B.1
  • 2
    • 0022774981 scopus 로고
    • Use of time functions to describe and explain circuit behavior
    • Am Ward, P., Caspi, P., Halbwachs, N., Use of time functions to describe and explain circuit behavior, IEE Proceedings, Pt.E, 1986, 122(5), 271.
    • (1986) IEE Proceedings, Pt.E , vol.122 , Issue.5 , pp. 271
    • Am Ward, P.1    Caspi, P.2    Halbwachs, N.3
  • 3
    • 0028728070 scopus 로고
    • Boolean process - An analytical approach to circuit representation
    • Bangalore: IEEE Computer Society Press
    • Min, Y., Boolean process - An analytical approach to circuit representation, in Proc. IEEE Third Asian Test Symposium, Nara, Japan, Bangalore: IEEE Computer Society Press, 1994, 249-254.
    • (1994) Proc. IEEE Third Asian Test Symposium, Nara, Japan , pp. 249-254
    • Min, Y.1
  • 4
    • 0029516698 scopus 로고
    • Boolean process - An analytical approach to circuit representation (II)
    • Bangalore: IEEE Computer Society Press
    • Min,Y., Zhao, Z., Li, Z., Boolean process - An analytical approach to circuit representation (II), in Proc. IEEE Fourth Asian Test Symposium, India, Bangalore: IEEE Computer Society Press, 1995, 26-32.
    • (1995) Proc. IEEE Fourth Asian Test Symposium, India , pp. 26-32
    • Min, Y.1    Zhao, Z.2    Li, Z.3
  • 5
    • 85080709737 scopus 로고    scopus 로고
    • Analytical delay models for delay testing
    • Bangalore: IEEE Computer Society Press
    • Min, Y., Zhao, Z., Li, Z., Analytical delay models for delay testing, in Proc. VLSI Design Conf. 96, India, Bangalore: IEEE Computer Society Press, 1996.
    • (1996) Proc. VLSI Design Conf. 96, India
    • Min, Y.1    Zhao, Z.2    Li, Z.3
  • 7
    • 27744591943 scopus 로고
    • Transients in combinational logic circuits
    • Washington, D. C. : Spartan Book
    • McCluskey, E. J., Transients in combinational logic circuits, in Redundancy Techniques for Computing Systems, Washington, D. C. : Spartan Book, 1962, 9-46.
    • (1962) Redundancy Techniques for Computing Systems , pp. 9-46
    • McCluskey, E.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.