Test generation for crosstalk-induced faults: Framework and computational results

Proceedings of the Asian Test Symposium

Volumn , Issue , 2000, Pages 305-310

  Chen, Wei Yu ^a   Gupta, Sandeep K ^a   Breuer, Melvin A ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MIXED SIGNAL TEST GENERATOR;

ALGORITHMS; COMBINATORIAL CIRCUITS; COMPUTATIONAL METHODS; COMPUTER DEBUGGING; COMPUTER SIMULATION; CROSSTALK; DIGITAL CIRCUITS; INTEGRATED CIRCUIT LAYOUT; VECTORS;

INTEGRATED CIRCUIT TESTING;

EID: 0034512340     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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