Photoacoustic spectroscopy to determine the optical properties of thin film 4H-SiC

Thin Solid Films

Volumn 515, Issue 4, 2006, Pages 2821-2823

  Astrath, N G C ^a   Bento, A C ^a   Baesso, M L ^a   Ferreira da Silva, A ^b   Persson, C ^c  

^a STATE UNIVERSITY OF MARINGÁ   (Brazil)

^b FEDERAL UNIVERSITY OF BAHIA   (Brazil)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Photoacoustic spectroscopy; Silicon carbide

Indexed keywords

BAND STRUCTURE; ELECTRON TRANSITIONS; PHOTOACOUSTIC SPECTROSCOPY; SILICON CARBIDE; THIN FILMS;

ABSORPTION SPECTRUM; OPTICAL TRANSITIONS; THERETICAL CALCULTIONS;

OPTICAL FILMS;

EID: 33750821759     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.08.009     Document Type: Article

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