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Volumn 515, Issue 4, 2006, Pages 2251-2256

Analyses of interfacial stresses and normal stresses within an elongated film strip/substrate system

Author keywords

Edge deflection; Film substrate system; Misfit strain; Residual stress

Indexed keywords

DISLOCATIONS (CRYSTALS); EDGE DETECTION; PLASMA SPRAYING; RESIDUAL STRESSES; THIN FILMS;

EID: 33750797788     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.06.023     Document Type: Article
Times cited : (11)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.