|
Volumn 515, Issue 4, 2006, Pages 2251-2256
|
Analyses of interfacial stresses and normal stresses within an elongated film strip/substrate system
|
Author keywords
Edge deflection; Film substrate system; Misfit strain; Residual stress
|
Indexed keywords
DISLOCATIONS (CRYSTALS);
EDGE DETECTION;
PLASMA SPRAYING;
RESIDUAL STRESSES;
THIN FILMS;
EDGE DEFLECTION;
INTERFACIAL STRESSES;
MISFIT STRAIN;
STRESS ANALYSIS;
|
EID: 33750797788
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2006.06.023 Document Type: Article |
Times cited : (11)
|
References (26)
|