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Volumn 2002-January, Issue , 2002, Pages 1058-1065

Overview of multilayered thin film theories for MEMS and electronic packaging applications

Author keywords

Electronic packaging thermal management; Electronics packaging; Finite element methods; Microelectromechanical systems; Micromechanical devices; Nonhomogeneous media; Silicon; Thermal stresses; Transistors; Workability

Indexed keywords

ELECTROMECHANICAL DEVICES; ELECTRONICS PACKAGING; FAILURE (MECHANICAL); FILM PREPARATION; FORECASTING; MEMS; MICROELECTROMECHANICAL DEVICES; MULTILAYERS; SILICON; STRESSES; THERMAL STRESS; TRANSISTORS;

EID: 84950157512     PISSN: 19363958     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2002.1012575     Document Type: Conference Paper
Times cited : (6)

References (10)
  • 2
    • 0030246587 scopus 로고    scopus 로고
    • An Analysis of an Engineering Model for the Thermal Mismatch Stresses at the interface of a Uniformly Heated Two Layer Structure
    • L.Matthys, An Analysis of an Engineering Model for the Thermal Mismatch Stresses at the interface of a Uniformly Heated Two Layer Structure, in: Journal of Microcircuits and Electronic Packaging, Vol.19 (1999) 323-329.
    • (1999) Journal of Microcircuits and Electronic Packaging , vol.19 , pp. 323-329
    • Matthys, L.1
  • 3
    • 0022787978 scopus 로고
    • Stress in Bi-Metal Thermostats
    • E.Suhir, Stress in Bi-Metal Thermostats, in: ASME Journal of Applied Mechanics, Vol.53 (1986) 657-660.
    • (1986) ASME Journal of Applied Mechanics , vol.53 , pp. 657-660
    • Suhir, E.1
  • 4
    • 0024734854 scopus 로고
    • Interfacial Stresses in Bimetal Thermostats
    • E.Suhir, Interfacial Stresses in Bimetal Thermostats, in: ASME Journal of Applied Mechanics, Vol.56 (1989) 595-600.
    • (1989) ASME Journal of Applied Mechanics , vol.56 , pp. 595-600
    • Suhir, E.1
  • 6
    • 0018444760 scopus 로고
    • Thermal Stress in Bonded Joints
    • W.T.Chen, C.W.Nelson, Thermal Stress in Bonded Joints, in: IBM.J.Res.Develop., Vol.23 (1979) 178-188.
    • (1979) IBM.J.Res.Develop. , vol.23 , pp. 178-188
    • Chen, W.T.1    Nelson, C.W.2
  • 9
    • 0033690242 scopus 로고    scopus 로고
    • Interfacial Shear Stresses, Peeling Stress, and Die Cracking Stress in Trilayer Electronic Assemblies
    • June
    • K.Wang, Y.Huang, A.Chandra, and K.X.Hu, Interfacial Shear Stresses, Peeling Stress, and Die Cracking Stress in Trilayer Electronic Assemblies, in: IEEE Transactions on Components and Packaging Technologies, Vol.23, no.2 (June, 2000) 309-319.
    • (2000) IEEE Transactions on Components and Packaging Technologies , vol.23 , Issue.2 , pp. 309-319
    • Wang, K.1    Huang, Y.2    Chandra, A.3    Hu, K.X.4
  • 10
    • 0026172299 scopus 로고
    • Interfacial Shear and Peel Stresses in Multilayered Thin Stacks Subjected to Uniform Thermal Loading
    • Y.H.Pao and Eisele, Interfacial Shear and Peel Stresses in Multilayered Thin Stacks Subjected to Uniform Thermal Loading, in: ASME Journal of Electronic Packaging, Vol. 113, (1991) 164-172
    • (1991) ASME Journal of Electronic Packaging , vol.113 , pp. 164-172
    • Pao, Y.H.1    Eisele2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.