One-sided process capability assessment in the presence of measurement errors

Quality and Reliability Engineering International

Volumn 22, Issue 7, 2006, Pages 771-785

  Pearn, W L ^a   Liao, Mou Yuan ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Confidence bound; Critical value; Gauge measurement errors; Onesided specification; Process capability indices

Indexed keywords

ELECTRONIC EQUIPMENT MANUFACTURE; ENGINEERING RESEARCH; MEASUREMENT ERRORS; PERFORMANCE; PROGRAM PROCESSORS;

CONFIDENCE BOUND; CRITICAL VALUES; GAUGE MEASUREMENT ERRORS; ONESIDED SPECIFICATIONS; PROCESS CAPABILITY INDICES;

PROCESS ENGINEERING;

EID: 33750702487     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.727     Document Type: Article

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