A design methodology for temperature variation insensitive low power circuits

Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Volumn 2006, Issue , 2006, Pages 410-415

  Kumar, Ranjith ^a   Kursun, Volkan ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

Design; Performance; Reliability

Indexed keywords

ELECTRIC POTENTIAL; OPTIMIZATION; POWER CONTROL; POWER SUPPLY CIRCUITS; RELIABILITY THEORY; TEMPERATURE MEASUREMENT;

ENERGY-DELAY PRODUCT (EDP); INSENSITIVE CIRCUITS; TEMPERATURE FLUCTUATIONS; TEMPERATURE VARIATION;

CMOS INTEGRATED CIRCUITS;

EID: 33750590187     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1127908.1128002     Document Type: Conference Paper

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