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Volumn 6317, Issue , 2006, Pages

Optical constants in the EUV Soft x-ray (5 ÷152 nm) spectral range of B4C thin films deposited by different deposition techniques

Author keywords

B4c; E beam; EUV soft X; Magnetron sputtering; Multilayer; Optical coatings; Optical constants; PLD

Indexed keywords

ATOMIC FORCE MICROSCOPY; BORON COMPOUNDS; DEPOSITION; LIGHT REFLECTION; MULTILAYERS; OPTICAL COATINGS; X RAY DIFFRACTION ANALYSIS;

EID: 33750578599     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.684088     Document Type: Conference Paper
Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.