Scanning photoelectron microscopic study of top-emission organic light-emitting device degradation under high-bias voltage

Journal of Applied Physics

Volumn 100, Issue 8, 2006, Pages

  Shin, H J ^a   Song, H J ^a   Lee, J ^b   Yoon, H J ^b   Chung, J ^c   Lee, J C ^c  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Korea Basic Science Institute (KBSI)   (South Korea)

^c Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; DATA REDUCTION; DEGRADATION; ELECTRIC POTENTIAL; PHOTOELECTRON SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY;

ORGANIC LAYERS; SCANNING PHOTOELECTRON MICROSCOPE (SPEM); TOP-EMISSION ORGANIC LIGHT-EMITTING DEVICE (TOLED);

LIGHT EMITTING DIODES;

EID: 33750506988     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2358414     Document Type: Article

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