Tip traveling and grain boundary effects in domain formation using piezoelectric force microscopy for probe storage applications

Applied Physics Letters

Volumn 89, Issue 17, 2006, Pages

  Kim, Yunseok ^a   Cho, Youngsang ^a   Hong, Seungbum ^b   Bühlmann, Simon ^b   Park, Hongsik ^b   Min, Dong Ki ^b   Kim, Seung Hyun ^c   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c INOSTEK Inc   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; PROBES;

PIEZOELECTRIC FORCE MICROSCOPY; TIP TRAVELING;

MAGNETIC DOMAINS;

EID: 33750485318     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2370502     Document Type: Article

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