Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape

Ultramicroscopy

Volumn 102, Issue 1, 2004, Pages 7-12

  Kuljanishvili, Irma ^a   Chakraborty, Subhasish ^a   Maasilta, I J ^a   Tessmer, S H ^a   Melloch, M R ^b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b Purdue University   (United States)

Author keywords

Cryomicroscopic methods; Microscopic methods; Specifically for solid interfaces and multilayers

Indexed keywords

ARBITRARY SHAPES; CHARGE ACCUMULATION; ELECTRIC-FIELD-SENSITIVE SCANNING PROBE MICROSCOPY; SPATIAL RESOLUTION;

DIELECTRIC MATERIALS; MICROSCOPIC EXAMINATION; NUMERICAL METHODS; PROBES; SCANNING; SENSITIVITY ANALYSIS; SURFACE PHENOMENA;

ELECTRIC FIELD EFFECTS;

AB INITIO CALCULATION; ARTICLE; DIELECTRIC CONSTANT; IMAGE ANALYSIS; IMAGING SYSTEM; MEASUREMENT; MICROSCOPY; MOLECULAR PROBE; THEORETICAL MODEL;

ALGORITHMS; MICROSCOPY, SCANNING PROBE; MODELS, THEORETICAL; OXADIAZOLES;

EID: 8844219668     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.07.004     Document Type: Article

References (18)

1. Y. Martin, D.W. Abraham, and H.K. Wickramashinghe Appl. Phys. Lett. 52 1988 1103
2. D.W. Abraham, C. Williams, J. Slinkman, and H.K. Wickramashinghe J. Vac. Sci. Technol. B 9 1991 703
3. Y. Huang, C.C. Williams, and J. Slinkman Appl. Phys. Lett. 66 1995 334
4. M.J. Yoo, T.A. Fulton, H.F. Hess, R.L. Willett, L.N. Dunkleberger, R.J. Chichester, L.N. Pfeiffer, and K.W. West Science 276 1997 579
5. A. Yacoby, H.F. Hess, T.A. Fulton, L.N. Pfeiffer, and K.W. West Solid State Commun. 111 1999 1
6. M.A. Erikkson, R.G. Beck, M. Topinka, J.A. Katine, R.M. Westervelt, K.L. Campman, and A.C. Gossard Appl. Phys. Lett. 69 1996 671
7. M.A. Topinka, B.J. LeRoy, R.M. Westervelt, S.E.J. Shaw, R. Fleischmann, E.J. Heller, K.D. Maranowski, and A.C. Gossard Nature 410 2001 183
8. S.H. Tessmer, P.I. Glicofridis, R.C. Ashoori, L.S. Levitov, and M.R. Melloch Nature 392 1998 51
9. S.H. Tessmer, P.I. Glicofridis, R.C. Ashoori, L.S. Levitov, and M.R. Melloch Nature 395 1998 724
10. G. Finkelstein, P.I. Glicofridis, R.C. Ashoori, and M. Shayegan Science 289 2000 90
11. S. Belaidi, P. Girard, and G. Leveque J. Appl. Phys. 81 3 1997 1023
12. A.A. Becker The Boundary Element Method in Engineering 1992 McGraw-Hill New York
13. S.H. Tessmer, G. Finkelstein, P.I. Glicofridis, and R.C. Ashoori Phys. Rev. B 66 2002 125308
14. J.D. Jackson Classical Electrodynamics 1975 John Wiley & Sons New York pp. 48, 147-149
15. Materials Analytical Services, 616 Hutton Street, Suite 101, Raleigh, NC 27606.
16. S. Urazhdin, I.J. Maasilta, S. Chakraborty, I. Moraru, and S.H. Tessmer Rev. Sci. Instrum. 71 2000 4170
17. S. Chakraborty, I.J. Maasilta, S.H. Tessmer, and M.R. Melloch Phys. Rev. B 69 2004 073308
18. M.A. Eriksson, R.G. Beck, M. Topinka, J.A. Katine, R.M. Westervelt, K.L. Campman, and A.C. Gossard Superlattice Microst. 20 1996 435