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Volumn 15, Issue 4, 2005, Pages 485-495

Polyferrocenylsilanes as protective charge migration coatings for dielectrics

Author keywords

Arc discharge; Charge migration; Negative charge accumulation; Polyferrocenylsilanes

Indexed keywords


EID: 33750453809     PISSN: 15741443     EISSN: 15741451     Source Type: Journal    
DOI: 10.1007/s10904-006-9003-5     Document Type: Article
Times cited : (4)

References (38)
  • 3
    • 0022797457 scopus 로고
    • (The materials studied in this work were Mylar, Kapton and Teflon.)
    • K. G. Balmain, J. Electrostat. 20, 95 (1987). (The materials studied in this work were Mylar, Kapton and Teflon.)
    • (1987) J. Electrostat. , vol.20 , pp. 95
    • Balmain, K.G.1
  • 28
    • 0035941073 scopus 로고    scopus 로고
    • I. Manners, Science 294, 1664 (2001).
    • (2001) Science , vol.294 , pp. 1664
    • Manners, I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.