Noncontact friction force microscopy based on quartz tuning fork sensors

Applied Physics Letters

Volumn 89, Issue 17, 2006, Pages

  Labardi, M ^a   Allegrini, M ^a,b  

^a UNIVERSITY OF PISA   (Italy)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NONCONTACT FRICTION FORCE MICROSCOPY; PHASE IMAGING; PIEZOELECTRIC SENSING; VIBRATION AMPLITUDE;

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; PIEZOELECTRIC DEVICES; QUARTZ; SENSORS;

MICROSCOPIC EXAMINATION;

EID: 33750448609     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2369637     Document Type: Article

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