Fault region localization: Product and process improvement based on field performance and manufacturing measurements

IEEE Transactions on Automation Science and Engineering

Volumn 3, Issue 4, 2006, Pages 423-439

  Mannar, Kamal ^b   Ceglarek, Darek ^a,b   Niu, Feng ^a,c   Abifaraj, Bassam ^c  

^a IEEE   (United States)

^b University of Wisconsin Madison   (United States)

^c MOTOROLA INC   (United States)

Author keywords

Diagnostics; Manufacturing; Product field performance; Product life cycle; Quality; Tolerance analysis; Warranty

Indexed keywords

DIAGNOSTICS; PRODUCT FIELD PERFORMANCE; PRODUCT LIFE CYCLE; QUALITY; TOLERANCE ANALYSIS; WARRANTY;

COST ACCOUNTING; CUSTOMER SATISFACTION; FITS AND TOLERANCES; INFORMATION ANALYSIS; PERFORMANCE; ROBUSTNESS (CONTROL SYSTEMS);

MANUFACTURING DATA PROCESSING;

EID: 33750075212     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2006.880526     Document Type: Article

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