Adjusted least squares approach for diagnosis of III-conditioned compliant assemblies

Journal of Manufacturing Science and Engineering, Transactions of the ASME

Volumn 123, Issue 3, 2001, Pages 453-461

  Rong, Q ^a   Shi, J ^b   Ceglarek, D ^c  

^a GENERAL ELECTRIC COMPANY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012791558     PISSN: 10871357     EISSN: 15288935     Source Type: Journal    
DOI: 10.1115/1.1365116     Document Type: Article

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