Optimal sensor distribution for variation diagnosis in multistation assembly processes

IEEE Transactions on Robotics and Automation

Volumn 19, Issue 4, 2003, Pages 543-556

  Ding, Yu ^a   Kim, Pansoo ^a   Ceglarek, Dariusz ^b   Jin, Jionghua ^c  

^a TEXAS A AND M UNIVERSITY   (United States)

^b University of Wisconsin Madison   (United States)

^c UNIVERSITY OF ARIZONA   (United States)

Author keywords

Diagnosability; Diagnosis of variation sources; Multistation assembly process; Sensor distribution

Indexed keywords

ASSEMBLY; FAILURE ANALYSIS; MATHEMATICAL MODELS; MATRIX ALGEBRA; PRODUCTIVITY; QUALITY ASSURANCE; RANDOM PROCESSES; STATE SPACE METHODS;

DIAGNOSABILITY; MULTISTATION ASSEMBLY PROCESSES; SENSOR DISTRIBUTION; VARIATION DIAGNOSIS;

SENSORS;

EID: 0041881582     PISSN: 1042296X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TRA.2003.814516     Document Type: Article

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