Strain enhanced p-type metal oxide semiconductor field effect transistors

Journal of Applied Physics

Volumn 100, Issue 6, 2006, Pages

  Belford, R E ^a   Guo, B P ^a   Xu, Q ^a   Sood, S ^a   Thrift, A A ^a   Teren, A ^a   Acosta, A ^a   Bosworth, L A ^a   Zell, J S ^a  

^a Belford Research Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRANSPORT; COMPRESSIVE STRAINS; EFFECTIVE MOBILITY; SATURATION CURRENT;

COMPRESSIVE STRENGTH; ELASTICITY; SEMICONDUCTOR JUNCTIONS; STRAIN; TENSILE STRENGTH; TRANSPORT PROPERTIES;

MOSFET DEVICES;

EID: 33749326392     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2335678     Document Type: Article

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