Verification of π-equivalent circuit based microwave noise model on AIIIBv HBTs with emphasis on HICUM

IEEE MTT-S International Microwave Symposium Digest

Volumn 2005, Issue , 2005, Pages 1419-1422

  Herricht, J ^a   Sakalas, P ^a,b   Schroter, M ^a,d   Zampardi, P ^c   Zimmermann, Y ^a   Korndorfer F ^e   Simukovic, A ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^c SKYWORKS SOLUTIONS INC   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e IHP   (Germany)

Author keywords

Correlation; HICUM; Noise; Noise modeling; Shot noise; SiGe Heterojunction bipolar transistors

Indexed keywords

CORRELATION; HICUM; NOISE MODELING; SIGE HETEROJUNCTION BIPOLAR TRANSISTORS;

EQUIVALENT CIRCUITS; SEMICONDUCTING SILICON COMPOUNDS; SHOT NOISE; SPURIOUS SIGNAL NOISE;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 33749257525     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1516953     Document Type: Conference Paper

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