Real-time detection of probe loss in atomic force microscopy

Applied Physics Letters

Volumn 89, Issue 13, 2006, Pages

  De, Tathagata ^a   Agarwal, Pranav ^a   Sahoo, Deepak R ^a   Salapaka, Murti V ^a  

^a Iowa State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SIGNALS; PIEZOACTUATION SIGNALS; REAL TIME SIGNALS; RELIABILITY INDEX;

ACTUATORS; ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; IMAGE ANALYSIS; OPTIMIZATION; PROBES;

REAL TIME SYSTEMS;

EID: 33749235651     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2357876     Document Type: Article

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