Accurate statistical approaches for generating representative workload compositions

Proceedings of the 2005 IEEE International Symposium on Workload Characterization, IISWC-2005

Volumn 2005, Issue , 2005, Pages 56-66

  Eeckhout, Lieven ^a   Sundareswarat, Rashmi ^b   Yi, Joshua J ^c   Lilja, David J ^d   Schrater, Paul ^b  

^a GHENT UNIVERSITY   (Belgium)

^b UNIVERSITY OF MINNESOTA   (United States)

^c FREESCALE SEMICONDUCTOR INC   (United States)

^d University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER ANALYSIS; STATISTICAL DATA ANALYSIS TECHNIQUES; WORKLOAD COMPOSITIONS;

COMPUTER SIMULATION; DATA REDUCTION; INDEPENDENT COMPONENT ANALYSIS; PRINCIPAL COMPONENT ANALYSIS; REDUNDANCY; SET THEORY;

MICROPROCESSOR CHIPS;

EID: 33749055123     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IISWC.2005.1526001     Document Type: Conference Paper

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