Structure and composition of chemically prepared and vacuum annealed InSb(0 0 1) surfaces

Applied Surface Science

Volumn 252, Issue 21, 2006, Pages 7684-7690

  Tereshchenko, O E ^a  

^a NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

Author keywords

Electron energy loss spectroscopy; HCl isopropanol treatment; InSb; Low energy electron diffraction; Passivation; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; ANTIMONY; HYDROCHLORIC ACID; LOW ENERGY ELECTRON DIFFRACTION; PASSIVATION; SURFACES; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ANTIMONY OXIDES; ELECTRON ENERGY-LOSS SPECTROSCOPY; HCL-ISOPROPANOL TREATMENT; INDIUM CHLORIDES;

INDIUM COMPOUNDS;

EID: 33748937168     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.03.068     Document Type: Article

References (25)

1. Jones N., Norris C., Nicklin C.L., Steadman P., Taylor J.S.G., McConville C.F., and Johnson A.D. Appl. Surf. Sci. 123/124 (1998) 141
2. Klem J.F., Tsao J.Y., Reno J.L., Datye A., and Chadda S. J. Vac. Sci. Technol. A 9 (1991) 2996
3. Vasquez R.P., Lewis B.F., and Grunthaner F.J. J. Vac. Sci. Technol. B 1 (1983) 791
4. Varekamp P.R., Björkqvist M., Göthelid M., and Karlsson U.O. Surf. Sci. Lett. 350 (1996) L221
5. John P., Miller T., and Chiang T.-C. Phys. Rev. B 39 (1989) 1730
6. Schweitzer M.O., Leibsle F.M., Jones T.S., McConville C.F., and Richardson N.V. Semicond. Sci. Technol. 8 (1993) S342
7. Haworth L., Lu J., Westwood D.I., and MacDonald J.E. Appl. Surf. Sci. 166 (2000) 253
8. Johnson A.D., Williams G.M., Pidduck A.J., Whitehouse C.R., Martin T., Elliot C.T., and Ashley T. Inst. Phy. Conf. Ser. 144 (1995) 204
9. Mönch W. Semiconductor Surfaces and Interfaces (1993), Springer-Verlag, Berlin
10. Yu W., Sullivan J.L., and Saied S.O. Surf. Sci. 352-354 (1996) 781
11. Kumpf C., et al. Phys. Rev. Lett. 86 (2001) 3586
12. Kolodziej J.J., Such B., and Szymonski M. Phys. Rev. Lett. 90 (2003) 226101
13. Evans S.D., Cao L.L., Egdell R.G., Droopad R., Parker S.D., and Stradling R.A. Surf. Sci. 226 (1990) 169
14. Clark S.A., Cairns J.W., Wilks S.P., Williams R.H., Johnson A.D., and Whitehouse C.R. Surf. Sci. 336 (1995) 193
15. McConville C.F., Jones T.S., Leibsle F.M., Driver S.M., Noakes T.C.Q., Schweitzer M.O., and Richardson N.V. Phys. Rev. B 50 (1994) 14965
16. Tereshchenko O.E., Chikichev S.I., and Terekhov A.S. J. Vac. Sci. Technol. A17 (1999) 2655
17. Tereshchenko O.E., Placidi E., Paget D., Chiaradia P., and Balzarotti A. Surf. Sci. 510 (2004) 237
18. In: Briggs D., and Seah M.P. (Eds). Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (1983), Wiley, New York
19. Haworth L., Lu J., Hill P., Westwood D.I., Macdonald J.E., Hartmann N., Schneider A., and Zahn D.R.T. J. Vac. Sci. Technol. B 16 (1998) 2254
20. Wang W.K., Simpson W.C., and Yarmoff J.A. Phys. Rev. B 61 (2000) 2164
21. Tereshchenko O.E., Paget D., Chiaradia P., Bonnet J.E., Wiame F., and Taleb-Ibrahimi A. Appl. Phys. Lett. 82 (2003) 4280
22. Aquino A.A., and Jones T.S. Appl. Surf. Sci. 104/105 (1996) 304
23. Chen Y., Schmidt J., Siller L., Barnard J.C., and Palmer R.E. Phys. Rev. 58 3 (1998) 1177
24. Massies J., Etienne P., Dezaly F., and Linh N.T. Surf. Sci. 99 (1980) 121
25. Chen W., Dumas M., Mao D., and Kahn A. J. Vac. Sci. Technol. B 10 4 (1992) 1886