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Volumn 515, Issue 2 SPEC. ISS., 2006, Pages 678-682

YSZ thin films deposited by e-beam technique

Author keywords

Electron beam assisted deposition; Solid oxide fuel cells (SOFC); Surface treatments; Vacuum deposition; X ray diffraction in crystal structure; YSZ thin films

Indexed keywords

CRYSTAL GROWTH; DEPOSITION; ELECTRON GUNS; SCANNING ELECTRON MICROSCOPY; SOLID OXIDE FUEL CELLS; SURFACE TREATMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 33748744251     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.242     Document Type: Article
Times cited : (45)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.