Transmission electron microscopy characterization of a Yttria-stabilized zirconia coating fabricated by electron beam-physical vapor deposition

Surface and Coatings Technology

Volumn 194, Issue 1, 2005, Pages 16-23

  Kato, T ^a   Matsumoto, K ^b   Matsubara, H ^a   Ishiwata, Y ^b   Saka, H ^c   Hirayama, T ^a   Ikuhara, Y ^a  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b TOSHIBA CORPORATION   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

Author keywords

EB PVD; FIB; Nanopores; TEM

Indexed keywords

PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THERMAL CONDUCTIVITY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

ELECTRON BEAM-PHYSICAL VAPOR DEPOSITION (EB-PVD); MONOCLINIC PHASES; PYRAMID GRAINS; YTTRIA-STABILIZED ZIRCONIA (YSZ);

YTTRIUM COMPOUNDS;

COATING;

EID: 13744254969     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2004.05.014     Document Type: Article

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