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Volumn 19, Issue 5, 2003, Pages 379-383
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Formation of YSZ films by thermal annealing of Y/Zr layers in air
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CERAMIC MATERIALS;
COATINGS;
FUEL CELLS;
INTERFEROMETERS;
MAGNETRON SPUTTERING;
MASS SPECTROMETRY;
MICROSTRUCTURE;
NANOSTRUCTURED MATERIALS;
OXIDATION;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
VAPOR DEPOSITION;
X RAY DIFFRACTION;
YTTRIUM;
COLUMNAR BOUNDARIES;
THERMAL DIFFUSION MIXING;
ZIRCONIA;
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EID: 0346342585
PISSN: 02670844
EISSN: None
Source Type: Journal
DOI: 10.1179/026708403225007590 Document Type: Article |
Times cited : (4)
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References (16)
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