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Volumn 26, Issue 4, 2006, Pages 289-294

Nano-mechanics and micro-tribological behavior of N+-implanted silicon

Author keywords

Friction and wear behavior; Ion implantation; MEMS; Single crystal silicon

Indexed keywords

ELASTIC MODULI; FRICTION; HARDNESS; ION IMPLANTATION; MECHANICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; WEAR RESISTANCE;

EID: 33748683003     PISSN: 10040595     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (11)
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  • 7
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    • Benkherourou O, Sahnoune S, Djabi M, et al. Analysis of photoemission lines in silicon nitrided layer formed by low-energy nitrgen ion implantation in silicon[J]. Vacuum, 1999, 53: 427-433.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.