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Volumn 74, Issue 12, 2006, Pages

Resonant tunneling characteristics in crystalline silicon/nanocrystalline silicon heterostructure diodes

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EID: 33748676468     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.125308     Document Type: Article
Times cited : (19)

References (31)
  • 3
    • 0034286492 scopus 로고    scopus 로고
    • IEESAM 0018-9235
    • L. Geppert, IEEE Spectrum IEESAM 0018-9235 37, 46 (2000).
    • (2000) IEEE Spectrum , vol.37 , pp. 46
    • Geppert, L.1
  • 8
    • 3242889846 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.1769072
    • X. Y. Chen and W. Z. Shen, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1769072 85, 287 (2004).
    • (2004) Appl. Phys. Lett. , vol.85 , pp. 287
    • Chen, X.Y.1    Shen, W.Z.2
  • 9
    • 33749159201 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.72.035309
    • X. Y. Chen and W. Z. Shen, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.035309 72, 035309 (2005).
    • (2005) Phys. Rev. B , vol.72 , pp. 035309
    • Chen, X.Y.1    Shen, W.Z.2
  • 10
    • 19944434358 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1832752
    • X. Y. Chen, W. Z. Shen, and Y. L. He, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1832752 97, 024305 (2005).
    • (2005) J. Appl. Phys. , vol.97 , pp. 024305
    • Chen, X.Y.1    Shen, W.Z.2    He, Y.L.3
  • 11
    • 0000873879 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.46.15337
    • K. A. Matveev and A. I. Larkin, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.46.15337 46, 15337 (1992).
    • (1992) Phys. Rev. B , vol.46 , pp. 15337
    • Matveev, K.A.1    Larkin, A.I.2
  • 14
    • 24244446233 scopus 로고
    • JAPIAU 0021-8979 10.1063/1.338082
    • Y. Ando and T. Itoh, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.338082 61, 1497 (1986).
    • (1986) J. Appl. Phys. , vol.61 , pp. 1497
    • Ando, Y.1    Itoh, T.2
  • 15
    • 6244304433 scopus 로고
    • APPLAB 0003-6951 10.1063/1.1654509
    • R. Tsu and L. Esaki, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1654509 22, 562 (1973).
    • (1973) Appl. Phys. Lett. , vol.22 , pp. 562
    • Tsu, R.1    Esaki, L.2
  • 16
    • 0004457553 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.30.840
    • F. Stern and S. Das Sarma, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.30.840 30, 840 (1984);
    • (1984) Phys. Rev. B , vol.30 , pp. 840
    • Stern, F.1    Das Sarma, S.2
  • 18
    • 20444439923 scopus 로고
    • PHRVAO 0031-899X 10.1103/PhysRev.152.683
    • D. J. BenDaniel and C. B. Duke, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.152.683 152, 683 (1966).
    • (1966) Phys. Rev. , vol.152 , pp. 683
    • Bendaniel, D.J.1    Duke, C.B.2
  • 23
    • 0001634804 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.45.3583
    • D. Z. Y. Ting, E. T. Yu, and T. C. McGill, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.45.3583 45, 3583 (1992).
    • (1992) Phys. Rev. B , vol.45 , pp. 3583
    • Ting, D.Z.Y.1    Yu, E.T.2    McGill, T.C.3
  • 26
  • 27
    • 0000712939 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.51.4289
    • T. B. Boykin, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.51.4289 51, 4289 (1995).
    • (1995) Phys. Rev. B , vol.51 , pp. 4289
    • Boykin, T.B.1
  • 31
    • 33746879594 scopus 로고    scopus 로고
    • Proceedings of the 5th IEEE Conference on Nanotechnology
    • D. P. Nackashi, C. J. Amsinck, N. H. DiSpigna, and P. D. Franzon, Proceedings of the 5th IEEE Conference on Nanotechnology, 2005, Vol. 2, p. 819.
    • (2005) , vol.2 , pp. 819
    • Nackashi, D.P.1    Amsinck, C.J.2    Dispigna, N.H.3    Franzon, P.D.4


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