Single-electron tunneling through Si nanocrystals dispersed in phosphosilicate glass thin films

Journal of Applied Physics

Volumn 86, Issue 6, 1999, Pages 3199-3203

  Inoue, Yoku ^a   Tanaka, Atsushi ^a   Fujii, Minoru ^a   Hayashi, Shinji ^a   Yamamoto, Keiichi ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001648824     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371189     Document Type: Article

References (22)

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