SCOPUS 정보 검색 플랫폼

Volumn 155, Issue 1-2, 2006, Pages 313-318

A novel method of analytical transmission electron microscopy for measuring highly accurately segregation to special grain boundaries or planar interfaces

(3) Walther, Thomas a Rečnik, Aleksander b Daneu, Nina b

a CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR (Germany)

b JO EF STEFAN INSTITUTE (Slovenia)

Author keywords

Analytical TEM; Grain boundary; Segregation; Solute excess

Indexed keywords

EID: 33748581366 PISSN: 00263672 EISSN: 14365073 Source Type: Journal
DOI: 10.1007/s00604-006-0562-5 Document Type: Conference Paper

Times cited : (10)

References (27)

1
- 51249190879
- Viswanathan R (1971) Metall Trans 2(3): 809
- (1971) Metall Trans , vol.2 , Issue.3 , pp. 809
- Viswanathan, R.¹

2
- 52449148841
- Rellick J R, McMahon C J, Marcus H L, Palmberg P W (1971) Metall Trans 2(5): 1492
- (1971) Metall Trans , vol.2 , Issue.5 , pp. 1492
- Rellick, J.R.¹ McMahon, C.J.² Marcus, H.L.³ Palmberg, P.W.⁴

3
- 0010460765
- Harris L A (1968) J Appl Phys 39(3): 1428
- (1968) J Appl Phys , vol.39 , Issue.3 , pp. 1428
- Harris, L.A.¹

4
- 0141985861
- Palmberg P W, Marcus H L (1969) ASM Trans Quart 62(4): 1016
- (1969) ASM Trans Quart , vol.62 , Issue.4 , pp. 1016
- Palmberg, P.W.¹ Marcus, H.L.²

5
- 3342883362
- Bonzel H P, Aaron H B (1971) Scripta Metall 5(12): 1057
- (1971) Scripta Metall , vol.5 , Issue.12 , pp. 1057
- Bonzel, H.P.¹ Aaron, H.B.²

6
- 34250480320
- Benninghoven A (1970) Z Phys 230(5): 403
- (1970) Z Phys , vol.230 , Issue.5 , pp. 403
- Benninghoven, A.¹

7
- 0017948569
- Ploog K, Fischer A (1978) J Vac Sci Technol 15(2): 255
- (1978) J Vac Sci Technol , vol.15 , Issue.2 , pp. 255
- Ploog, K.¹ Fischer, A.²

8
- 36549104814
- Cerezo A, Godfrey T J, Smith G D W (1988) Rev Sci Instr 59(6): 862
- (1988) Rev Sci Instr , vol.59 , Issue.6 , pp. 862
- Cerezo, A.¹ Godfrey, T.J.² Smith, G.D.W.³

9
- 0028383168
- Deconihout B, Bostel A, Bas P, Chambreland S, Letellier L, Danoix F, Blavette D (1994) Appl Surf Sci 76(1-4): 145
- (1994) Appl Surf Sci , vol.76 , Issue.1-4 , pp. 145
- Deconihout, B.¹ Bostel, A.² Bas, P.³ Chambreland, S.⁴ Letellier, L.⁵ Danoix, F.⁶ Blavette, D.⁷

10
- 0019057205
- Bender B, Williams D B, Notis M R (1980) J Am Ceram Soc 63(9-10): 542
- (1980) J Am Ceram Soc , vol.63 , Issue.9-10 , pp. 542
- Bender, B.¹ Williams, D.B.² Notis, M.R.³

11
- 0026187127
- Laws M S, Goodhew P J (1991) Acta Metall Mater 39(7): 1525
- (1991) Acta Metall Mater , vol.39 , Issue.7 , pp. 1525
- Laws, M.S.¹ Goodhew, P.J.²

12
- 0028515505
- Bruley J, Höche T, Kleebe H J, Rühle M (1994) J Am Ceram Soc 77(9): 2273
- (1994) J Am Ceram Soc , vol.77 , Issue.9 , pp. 2273
- Bruley, J.¹ Höche, T.² Kleebe, H.J.³ Rühle, M.⁴

13
- 0033921025
- Keast V J, Williams D B (2000) J Microsc 199(1): 45
- (2000) J Microsc , vol.199 , Issue.1 , pp. 45
- Keast, V.J.¹ Williams, D.B.²

14
- 0001126304
- Bruley J, Bremer U, Krasevec V (1992) J Am Ceram Soc 75(11): 3127
- (1992) J Am Ceram Soc , vol.75 , Issue.11 , pp. 3127
- Bruley, J.¹ Bremer, U.² Krasevec, V.³

15
- 0343052722
- Alber U, Müllejans H, Rühle M (1997) Ultramicroscopy 69(2): 105
- (1997) Ultramicroscopy , vol.69 , Issue.2 , pp. 105
- Alber, U.¹ Müllejans, H.² Rühle, M.³

16
- 0033204809
- Bruley J, Cho J, Chan H M, Harmer M P, Rickman J M (1999) J Am Ceram Soc 82(10): 2865
- (1999) J Am Ceram Soc , vol.82 , Issue.10 , pp. 2865
- Bruley, J.¹ Cho, J.² Chan, H.M.³ Harmer, M.P.⁴ Rickman, J.M.⁵

17
- 0033349222
- Keast V J, Williams D B (1999) Acta Mater 47(15-16): 3999
- (1999) Acta Mater , vol.47 , Issue.15-16 , pp. 3999
- Keast, V.J.¹ Williams, D.B.²

18
- 0009384432
- Bruley J (1992) Philos Mag Lett 66(1): 47
- (1992) Philos Mag Lett , vol.66 , Issue.1 , pp. 47
- Bruley, J.¹

19
- 0031998238
- Gu H, Cannon R M, Rühle M (1998) J Mater Res 13(2): 376
- (1998) J Mater Res , vol.13 , Issue.2 , pp. 376
- Gu, H.¹ Cannon, R.M.² Rühle, M.³

20
- 0029386738
- Kaplan W D, Müllejans H, Rühle M, Rödel J, Claussen N (1995) J Am Ceram Soc 78(10): 2841
- (1995) J Am Ceram Soc , vol.78 , Issue.10 , pp. 2841
- Kaplan, W.D.¹ Müllejans, H.² Rühle, M.³ Rödel, J.⁴ Claussen, N.⁵

21
- 0346197288
- Test of a new analytical method to measure the composition of a planar fault
- th Int Conf Electron Microsc. In; Cross R, Engelbrecht J, Witcomb M (eds) Durban
- th Int Conf Electron Microsc. In; Cross R, Engelbrecht J, Witcomb M (eds) Durban, Microsc Soc South Africa 1: 535
- (2002) Microsc Soc South Africa , vol.1 , pp. 535
- Walther, T.¹ Rečnik, A.² Daneu, N.³

22
- 3543065369
- Walther T, Daneu N, Recnik A (2004) Interface Sci 12(2-3): 267
- (2004) Interface Sci , vol.12 , Issue.2-3 , pp. 267
- Walther, T.¹ Daneu, N.² Recnik, A.³

23
- 0000520263
- Goldstein J I, Costley J L, Lorimer G W, Reed S J B (1977) Scanning Electr Microsc 1: 315
- (1977) Scanning Electr Microsc , vol.1 , pp. 315
- Goldstein, J.I.¹ Costley, J.L.² Lorimer, G.W.³ Reed, S.J.B.⁴

24
- 4344564837
- Walther T (2004) J Microsc 215(2): 191
- (2004) J Microsc , vol.215 , Issue.2 , pp. 191
- Walther, T.¹

25
- 0016717822
- Cliff G, Lorimer G W (1975) J Microsc 103(2): 203
- (1975) J Microsc , vol.103 , Issue.2 , pp. 203
- Cliff, G.¹ Lorimer, G.W.²

26
- 0346197289
- Application of a new method for measuring small amounts of dopants at planar faults: Tin-rich IBs in zinc oxide
- th Int Conf Electron Microsc. In: Cross R, Engelbrecht J, Sewell T, Witcomb M (eds) Durban
- th Int Conf Electron Microsc. In: Cross R, Engelbrecht J, Sewell T, Witcomb M (eds) Durban, Microsc Soc South Africa 3: 63
- (2002) Microsc Soc South Africa , vol.3 , pp. 63
- Daneu, N.¹ Walther, T.² Recnik, A.³

27
- 0035526627
- Rečnik A, Daneu N, Walther T, Mader W (2001) J Am Ceram Soc 84(11): 2657
- (2001) J Am Ceram Soc , vol.84 , Issue.11 , pp. 2657
- Rečnik, A.¹ Daneu, N.² Walther, T.³ Mader, W.⁴

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