A quantitative comparison and analysis on rewiring techniques

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Volumn 1, Issue , 2003, Pages 242-245

  Tang, W C ^a   Lo, W H ^a   Lam, T K ^b   Mok, K K ^b   Ho, C K ^b   Yeung, S H ^b   Fan, H B ^b   Wu, Y L ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b UNIVERSITY OF VICTORIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPREHENSIVE ANALYSIS; QUANTITATIVE COMPARISON; RUNTIMES;

EID: 33748566569     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICASIC.2003.1277533     Document Type: Conference Paper

References (10)

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