FIRE: A fault-independent combinational redundancy identification algorithm

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 4, Issue 2, 1996, Pages 295-301

  Iyer, Mahesh A ^a   Abramovici, Miron ^b  

^a SYNOPSYS INC   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

Automatic test generation; Logic synthesis; Redundancy identification

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COMBINATORIAL CIRCUITS; ERROR DETECTION; FAILURE ANALYSIS; REDUNDANCY;

AUTOMATIC TEST GENERATION; FAULT INDEPENDENT ALGORITHM; LOGIC SYNTHESIS; REDUNDANCY IDENTIFICATION;

LOGIC DESIGN;

EID: 0030166346     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.502203     Document Type: Article

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