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Volumn 2005, Issue , 2005, Pages 185-190

A soft error monitor using switching current detection

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; ERRORS; SIGNAL PROCESSING; STATIC RANDOM ACCESS STORAGE; SWITCHING SYSTEMS;

EID: 33748537704     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2005.15     Document Type: Conference Paper
Times cited : (14)

References (11)
  • 1
    • 9144234352 scopus 로고    scopus 로고
    • Characterization of soft errors caused by single event upsets in CMOS processes
    • April-June
    • Karnik, T., Hazucha, P., "Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes," IEEE Transactions on Dependable and Secure Computing, VOL. 1, NO. 2, April-June 2004.
    • (2004) IEEE Transactions on Dependable and Secure Computing , vol.1 , Issue.2
    • Karnik, T.1    Hazucha, P.2
  • 5
    • 0036927879 scopus 로고    scopus 로고
    • The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction
    • Baumann, R., "The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction," Electron Devices Meeting, 2002.
    • (2002) Electron Devices Meeting
    • Baumann, R.1
  • 10
    • 33748561589 scopus 로고    scopus 로고
    • 70nm BPTM models http://www-device.eecs.berkeley.edu/~ptm/mosfet.html.
    • 70nm BPTM Models
  • 11
    • 1642276264 scopus 로고    scopus 로고
    • Statistical analysis of subthreshold leakage current for VLSI circuits
    • Rao, R., Srivastava, A., Blaauw, D., Sylvester, D., Statistical analysis of subthreshold leakage current for VLSI circuits, IEEE Transactions on VLSI, VOL. 12, Issue 2, 2004.
    • (2004) IEEE Transactions on VLSI , vol.12 , Issue.2
    • Rao, R.1    Srivastava, A.2    Blaauw, D.3    Sylvester, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.