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Volumn 2006, Issue , 2006, Pages 252-257

Combining linear and non-linear test vector compression using correlation-based rectangular encoding

Author keywords

[No Author keywords available]

Indexed keywords

LINEAR DECOMPRESSOR; NONLINEAR DECODERS;

EID: 33748486328     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.25     Document Type: Conference Paper
Times cited : (11)

References (11)
  • 2
    • 0034476621 scopus 로고    scopus 로고
    • A mixed-mode BIST scheme based on the reseeding of folding counters
    • [Hellebrand 00]
    • [Hellebrand 00] Hellebrand, S., H.-G. Liang, and H.-J. Wunderlich, "A Mixed-Mode BIST Scheme Based on the Reseeding of Folding Counters," Proc. of Int. Test Conf., pp. 778-784, 2000.
    • (2000) Proc. of Int. Test Conf. , pp. 778-784
    • Hellebrand, S.1    Liang, H.-G.2    Wunderlich, H.-J.3
  • 4
    • 0036446482 scopus 로고    scopus 로고
    • Reducing test data volume using LFSR reseeding with seed compression
    • [Krishna 02]
    • [Krishna 02] Krishna, C.V., and N.A. Touba, "Reducing Test Data Volume Using LFSR Reseeding with Seed Compression", Proc. of IEEE International Test Conference, pp. 321 -330, 2001.
    • (2001) Proc. of IEEE International Test Conference , pp. 321-330
    • Krishna, C.V.1    Touba, N.A.2
  • 5
    • 3142689875 scopus 로고    scopus 로고
    • 3-Stage variable length continuous-flow scan vector decompression scheme
    • [Krishna 04]
    • [Krishna 04] Krishna, C.V., and N.A. Touba, "3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme", Proc. of IEEE VLSI Test Symposium, pp. 79-86, 2004.
    • (2004) Proc. of IEEE VLSI Test Symposium , pp. 79-86
    • Krishna, C.V.1    Touba, N.A.2
  • 6
    • 0035687722 scopus 로고    scopus 로고
    • Two-dimensional test data compression for scan-based deterministic BIST
    • [Liang 01]
    • [Liang 01] Liang, H.-G., S. Hellebrand, and H.-.T. Wunderlich, "Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST," Proc. Int. Test Conf., pp. 894-902, 2001.
    • (2001) Proc. Int. Test Conf. , pp. 894-902
    • Liang, H.-G.1    Hellebrand, S.2    Wunderlich, H.-T.3
  • 7
    • 0036446078 scopus 로고    scopus 로고
    • Embedded deterministic test for low cost manufacturing test
    • [Rajski 02]
    • [Rajski 02] Rajski, J., et al., "Embedded Deterministic Test for Low Cost Manufacturing Test," Proc. of Int. Test Conf., pp. 301-310, 2002.
    • (2002) Proc. of Int. Test Conf. , pp. 301-310
    • Rajski, J.1
  • 8
    • 33751071474 scopus 로고    scopus 로고
    • Method for clustered test pattern generation
    • [Rajski 03], US. Patent No. 6,662,327, Dec. 9
    • [Rajski 03] Rajski, J., "Method for Clustered Test Pattern Generation", US. Patent No. 6,662,327, Dec. 9, 2003.
    • (2003)
    • Rajski, J.1
  • 9
    • 4444343146 scopus 로고    scopus 로고
    • Combining dictionary coding and LFSR reseding for test data compression
    • [Sun 04]
    • [Sun 04] Sun, X., L. Kinney, and B. Vinnakota, "Combining Dictionary Coding and LFSR Reseding for Test Data Compression," Proc. Design Autom. Conf., pp. 944-947, 2004.
    • (2004) Proc. Design Autom. Conf. , pp. 944-947
    • Sun, X.1    Kinney, L.2    Vinnakota, B.3
  • 11
    • 28444489616 scopus 로고    scopus 로고
    • Using statistical transformations to improve compression for linear decompressors
    • [Ward 05]
    • [Ward 05] Ward. I. S., Schattauer, C., and N. A. Touba, "Using Statistical Transformations to Improve Compression for Linear Decompressors," Proc. Defect Fault Tol. Symp., pp. 42-50, 2005.
    • (2005) Proc. Defect Fault Tol. Symp. , pp. 42-50
    • Ward, I.S.1    Schattauer, C.2    Touba, N.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.