An analysis based on fault injection of hardening techniques for SRAM-based FPGAs

IEEE Transactions on Nuclear Science

Volumn 53, Issue 4, 2006, Pages 2054-2059

  Sterpone, L ^a   Violante, M ^a   Rezgui, S ^b  

^a POLITECNICO DI TORINO   (Italy)

^b XILINX INC   (United States)

Author keywords

Dependability; Fault injection; SRAM based FPGAs; Triple modular redundancy (TMR)

Indexed keywords

RADIATION HARDENING; STATIC RANDOM ACCESS STORAGE;

FAULT INJECTION; TRIPLE MODULAR REDUNDANCY (TMR);

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 33748353624     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.880937     Document Type: Conference Paper

References (11)

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