Nanoindentation and birefringence measurements on fused silica specimen exposed to low-energy femtosecond pulses

Optics Express

Volumn 14, Issue 18, 2006, Pages 8360-8366

  Bellouard, Yves ^a   Colomb, Tristan ^b   Depeursinge, Christian ^b   Dugan, Mark ^c   Said, Ali A ^c   Bado, Philippe ^c  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b EPFL   (Switzerland)

^c TRANSLUME INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DENSIFICATION; NANOSTRUCTURED MATERIALS; REFRACTIVE INDEX;

BIREFRINGENCE MEASUREMENTS; LOW-ENERGY FEMTOSECOND PULSES; NANOINDENTATION;

FUSED SILICA;

EID: 33748314443     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.008360     Document Type: Article

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