Resistance and resistance fluctuations in random resistor networks under biased percolation

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 65, Issue 6, 2002, Pages

  Pennetta, C ^a   Reggiani, L ^a   Trefán, Gy ^b   Alfinito, E ^a  

^a NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; MONTE CARLO METHODS; NONLINEAR SYSTEMS;

ELECTRICAL BIAS; MECHANICAL STABILITY; PERCOLATION THRESHOLD; RANDOM RESISTOR NETWORK (RRN);

RESISTORS;

EID: 33748289578     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.65.066119     Document Type: Article

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