Thermal effects on the electrical degradation of thin film resistors

Physica A: Statistical Mechanics and its Applications

Volumn 266, Issue 1-4, 1999, Pages 214-217

  Pennetta, C ^a   Reggiani, L ^a   Kiss, L B ^b  

^a UNIVERSITY OF SALENTO   (Italy)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; MONTE CARLO METHODS; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS; THIN FILM DEVICES;

BIASED PERCOLATION MODEL; ELECTRICAL DEGRADATION;

RESISTORS;

EID: 0344287220     PISSN: 03784371     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-4371(98)00594-9     Document Type: Article

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