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Volumn 89, Issue 9, 2006, Pages

Effect of the misorientation of the 4H-SiC substrate on the open volume defects in GaN grown by metal-organic chemical vapor deposition

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); GALLIUM NITRIDE; GROWTH (MATERIALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; POSITRON ANNIHILATION SPECTROSCOPY;

EID: 33748282726     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2338887     Document Type: Article
Times cited : (6)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.