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Volumn 200, Issue 22-23 SPEC. ISS., 2006, Pages 6465-6468
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Constitution of thick oxygen-containing cubic boron nitride films
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CERAMIC COATINGS;
COMPOSITION;
COMPRESSIVE STRESS;
CRYSTAL LATTICES;
CRYSTALLOGRAPHY;
DEPOSITION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MAGNETRON SPUTTERING;
NUCLEATION;
STOICHIOMETRY;
X RAY DIFFRACTION ANALYSIS;
CRYSTALLOGRAPHIC STRUCTURE;
CUBIC BORON NITRIDE FILMS;
NUCLEATION LAYER;
OXYGEN-CONTAINING FILMS;
REACTIVE MAGNETRON SPUTTERING;
CUBIC BORON NITRIDE;
AUGER ELECTRON SPECTROSCOPY;
CERAMIC COATINGS;
COMPOSITION;
COMPRESSIVE STRESS;
CRYSTAL LATTICES;
CRYSTALLOGRAPHY;
CUBIC BORON NITRIDE;
DEPOSITION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MAGNETRON SPUTTERING;
NUCLEATION;
STOICHIOMETRY;
X RAY DIFFRACTION ANALYSIS;
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EID: 33748135622
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2005.11.118 Document Type: Article |
Times cited : (42)
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References (16)
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