Electrochemical migration of land grid array sockets under highly accelerated stress conditions

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn 2005, Issue , 2005, Pages 238-244

  Yang, Shuang ^a   Wu, Ji ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Dendrite; HAST; Interconnect; Silver electrochemical migration; Socket; Surface insulation resistance (SIR)

Indexed keywords

HAST; INTERCONNECT; SILVER ELECTROCHEMICAL MIGRATION; SURFACE INSULATION RESISTANCE (SIR);

DENDRIMERS; ELASTOMERS; ELECTROCHEMISTRY; INSULATING MATERIALS; STRESS ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRIC CONNECTORS;

EID: 33747438925     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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