Twin coarsening in CdTe(1 1 1) films grown on GaAs(1 0 0)

Acta Materialia

Volumn 54, Issue 16, 2006, Pages 4285-4291

  Polop, C ^a   Mora Sero I ^b   Munuera, C ^c   Garcia de Andres J ^a   Munoz Sanjose V ^b   Ocal, C ^c  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSITY OF VALENCIA   (Spain)

^c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Atomic force microscopy (AFM); Coarsening; Semiconductor; Stacking faults; Twinning

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; FILM GROWTH; SEMICONDUCTING CADMIUM COMPOUNDS; STACKING FAULTS; TWINNING;

COARSENING; GRAIN COARSENING; RIPPLED PATTERN; SCANNING FORCE MICROSCOPY;

SEMICONDUCTING FILMS;

EID: 33747361898     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.05.025     Document Type: Article

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