The dependence of the structural and optical properties on the CdTe epitaxial layer thicknesses in CdTe (111)/GaAs (100) heterostructures

Applied Surface Science

Volumn 140, Issue 1-2, 1999, Pages 1-11

  Han, M S ^a   Kang, T W ^a   Kim, T W ^b  

^a Dongguk University   (South Korea)

^b Kwangwoon University   (South Korea)

Author keywords

61.10. i; 61.50. f; 71.35.+z; 78.55.Et; CdTe epitaxial layers; Dependence; Structural and optical properties

Indexed keywords

EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL LAYERS; SEMICONDUCTING CADMIUM TELLURIDE;

HETEROJUNCTIONS;

EID: 0033075066     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00363-8     Document Type: Article

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